With the scanning electron microscope, SEM images of the surfaces of solid particles can be taken with high magnification and depth of field.
EDX analysis is used to determine the material composition. An energy dispersive X-ray analysis enables the determination of the element composition on the surfaces imaged by SEM images. An element mapping is used to determine the distribution of the chemical elements over a surface, which allows differences in the element distribution to be identified and conclusions to be drawn, e.g. on material compositions.